INTERMITTENT FAULT DETECTION & ISOLATION SYSTEM 2.0

IFD-5120 Single Rack
IFD-5120 Single Rack pictured

(Patented with Additional U.S. and Foreign Patents Pending)

IFDIS 2.0
IFD-5120 Dual Rack pictured with Environmental Chamber, Vibration Table, and Interface Test Adapter (ITA)
IFDIS 2.0 G10 Connector
IFDIS and IFDIS 2.0 Standard Front Panel Connector

Intermittent Fault Detection & Isolation System 2.0™ (IFDIS 2.0™)

The IFDIS 2.0 is capable of interfacing in increments of 1,280 electrical connection points. IFDIS 2.0 is a patented diagnostic instrument that can simultaneously and continuously monitor all unit under test (UUT) circuits, individually at the same time, detecting intermittent faults that occur, even as short as *50 nanoseconds (0.00000005 seconds) in duration.

In addition to detecting and isolating intermittent faults, the IFDIS 2.0 AutoMap feature will automatically interrogate and store the as-designed wiring configuration for a good unit and then based on that “gold” configuration, detect any open, short, ohmic, impedance, drift or mis-wiring problems in subsequent UUTs.

Features

  • Utilized in depots and back shops
  • Detects and isolates intermittent failures in electronics and avionics
  • Detects and isolates permanent and intermittent shorts, opens, instability and Electromagnetic Interference (EMI) events
  • Rapid set-up with powerful test software
  • Quick testing: results displayed real-time
  • Easily expandable in 1,280 test point increments

Functions

  • Intermittency – detected to less than *50ns on every test point individually, simultaneously and continuously
  • Continuity – programmable continuity checks against referenced values
  • Log Scope – instant display of a circuits or component’s stability
  • Shorts – two modes providing shorts indication and shorts tracing capability
  • Analyze – provides an impedance signature for the Unit Under Test
  • AutoMap – rapid mapping of circuits for complex and/or ad hoc testing

Benefits

  • IFDIS 2.0 eliminates:
    • Repeated returns of the same assembly for repair
    • Excessive spare part stock to cover units out of service
    • Downtime to replace units
    • Scraping costs associated with unrepairable units
    • Wasted test time using technology that cannot detect intermittent faults
  • Reduces No Fault Found (NFF), Can Not Duplicate (CND), Re-Test OK (RTOK), No Evidence of Failure (NEOF)
  • Reduces life-cycle support costs
  • Increases operational availability, asset availability, and mission capable rates
  • Compliance with US Department of Defense (DoD) MIL-PRF-32516 for electronic test equipment, intermittent fault detection and isolation for chassis and backplane conductive paths

For Pricing and Delivery Information, please call (801) 710-1618

Patented, with additional U.S. and foreign patents pending