INTERMITTENT FAULT DETECTION & ISOLATION SYSTEM 2.0
(Patented with Additional U.S. and Foreign Patents Pending)
Intermittent Fault Detection & Isolation System 2.0™ (IFDIS 2.0™)
The IFDIS 2.0 is capable of interfacing in increments of 1,280 electrical connection points. IFDIS 2.0 is a patented diagnostic instrument that can simultaneously and continuously monitor all unit under test (UUT) circuits, individually at the same time, detecting intermittent faults that occur, even as short as *50 nanoseconds (0.00000005 seconds) in duration.
In addition to detecting and isolating intermittent faults, the IFDIS 2.0 AutoMap feature will automatically interrogate and store the as-designed wiring configuration for a good unit and then based on that “gold” configuration, detect any open, short, ohmic, impedance, drift or mis-wiring problems in subsequent UUTs.
Features
- Utilized in depots and back shops
- Detects and isolates intermittent failures in electronics and avionics
- Detects and isolates permanent and intermittent shorts, opens, instability and Electromagnetic Interference (EMI) events
- Rapid set-up with powerful test software
- Quick testing: results displayed real-time
- Easily expandable in 1,280 test point increments
Functions
- Intermittency – detected to less than *50ns on every test point individually, simultaneously and continuously
- Continuity – programmable continuity checks against referenced values
- Log Scope – instant display of a circuits or component’s stability
- Shorts – two modes providing shorts indication and shorts tracing capability
- Analyze – provides an impedance signature for the Unit Under Test
- AutoMap – rapid mapping of circuits for complex and/or ad hoc testing
Benefits
- IFDIS 2.0 eliminates:
- Repeated returns of the same assembly for repair
- Excessive spare part stock to cover units out of service
- Downtime to replace units
- Scraping costs associated with unrepairable units
- Wasted test time using technology that cannot detect intermittent faults
- Reduces No Fault Found (NFF), Can Not Duplicate (CND), Re-Test OK (RTOK), No Evidence of Failure (NEOF)
- Reduces life-cycle support costs
- Increases operational availability, asset availability, and mission capable rates
- Compliance with US Department of Defense (DoD) MIL-PRF-32516 for electronic test equipment, intermittent fault detection and isolation for chassis and backplane conductive paths
For Pricing and Delivery Information, please call (801) 710-1618
Patented, with additional U.S. and foreign patents pending