INTERMITTENT FAULT DETECTION & ISOLATION SYSTEM (IFDIS™)
At the heart of the IFDIS™ is patented, state of the art, intermittent fault detection circuitry which simultaneously and continuously monitors every single electrical path in the chassis, all at the same time, while exposing the UUT to the simulated operational environment. The intermittent fault detection analog hardware neural network circuitry detects and isolates intermittent / No Fault Found (NFF) events as short as *50 nanoseconds (0.00000005 seconds) occuring on any circuit during test. Graphical test results show the precise locations of the intermittent fault for quick, surgical repairs of the problems. In addition to detecting and isolating intermittent faults, the IFDIS™ will also automatically interrogate and store the as-designed wiring configuration for a good unit and then based on that "gold" configuration, will detect any open, short, ohmic, impedance, drift or mis-wiring problem in subsequent UUTs.
The IFDIS™ includes an environmental chamber capable of subjecting a Unit Under Test (UUT) to a thermal environment of -100°F to 350°F in a precisely controlled manner. A 2,205 lbf vibration platform with a 2 inch peak to peak displacement and 78 inch/second velocity that includes a trunnion mounting, 13 inch diameter table, degauss coil, active suspension system and cooling blower with a 12 foot flex duct.
The IFDIS™ includes custom Interface Test Adaptation (ITA) which connects to all the chassis circuitry through both internal and external connections. The ITA includes Form, Fit & Interface replicas of the UUT electronic modules. Tying the environmental system together is a master control PC, color laser printer, uninterruptible power supplies, a shaker expander head, hardware to interface the shaker and chamber, interconnecting wiring, miscellaneous hardware, and master control software which includes UUT configuration and environmental stress profiles.
Installed in 256 test point modules (1,280 per 7U rack-space), the IFDIS™ test range coverage is virtually unlimited. Regardless of the number of test lines, the IFDIS™ does not lose a nanosecond of test coverage.
* Intermittent fault detection specifications measured using Hewlett-Packard 8111A Pulse/Function Generator
Patented, with additional U.S. and foreign patents pending