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IFD
Aging Wiring / No-Fault-Found / Intermittent Fault Detectors:
- High speed
intermittent event detection and continuity verification, essential for
aging-wiring type defects.
- Patented "Paralog"
(Parallel/Analog) sensing, all-test-points, all-the-time technology,
guarantees you will be measuring the
right circuit at the right time to detect aging/intermittent/NFF events.
- There is absolutely NO test point
scanning, NO digital sampling and NO missed intermittent events.
- Methodology more closely
simulates actual operational conditions than any other testing method.
- Provides maximum test coverage and sustained equipment
reliability. Several orders of magnitude greater than all other
traditional testing means.
- Radical
breakthrough technology adds a whole new dimension to testing.
- Sets a new standard for safety
and reliability testing.
- Tests directly for the cause of
failure (intermittence), not ambiguous engineering requirements
(fractions of an milliohm).
- Uses patented Analog Neural
Network, Omnipresent Sensing technology.
- Super high sensitivity detects
aging problems, even before they become dangerous failures.
- No measurement gaps on any test
point at any time, guarantees results.
- Can test thousands of lines,
individually,
yet simultaneously and continuously.
- Designed and built for the
avionics workplace.
- Tests at safe (3.5 volts max) levels.
- Testing can be performed in-situ,
no need to remove or disconnect attached LRUs or other devices.
- Test from a single connection
point with no need for long return lines from the back of the aircraft.
- Tests wiring, controls, sensors,
motors, busses, connectors, LRUs, etc.
- Technician level set-up and
operation.
- Fully menu driven operation and
self-learn
capability.
- Full test documentation and
archiving capability, and customizable for your needs.
- Designed for
expansion and
non-obsolescence.
- Open system architecture allows
expandability and reduces obsolescence.
- Operating software allows
for easy user modifications.
- Dozens of add-on diagnostic
technologies can be integrated into one platform.
- Customized versions available for
unique testing requirements.
- Benefits.
- Can greatly increase system safety
and reliability while reducing maintenance and life-cycle costs.
- On-board, or "Smart Wire"
installations can greatly multiply all benefits while reducing testing
costs.
- New Scope and Sweep additions
allow for a broader coverage of component and other in-situ tests.
- Generic Neural Network sensor
interface opens up the possibility of a wide variety of new, and
previously unavailable, testing
and interface devices such as chemical sniffers, overheated insulation
(out-gassing)
sniffers, etc.
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