As is typical of any group effort to resolve a complex problem, you are going to get a broad range of views on what the most important aspects of the problem are.  These views are of course going to be based on the background experiences of each individual in the group.  Our main purpose in attending this meeting is to add yet another view of the problem and to share our experiences with the “testing” aspect of the problem that we feel, has to date, been overlooked and in large measure is the aging problem.

To give you a little background... our company’s founders have been researching the cause and effects of aging avionics and electronics for over 30 years now, in a mostly “hands-on” way, while maintaining Air Force weapon and guidance systems, test programming, analyzing root cause defects in the Physics of Failure Laboratory, as well as product assurance / HALT testing and tracking of product returns in the electronics manufacturing industry.

Over the next few slides, we intend to share with you what we see as the “enabling  or missing key” to resolving a large portion of the “aging wiring” issues we are all concerned with.


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